1. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit.,Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
![](/design/images/bookmore.png)
![](/design/images/visualshelfbtn.png)
2. System-on-a-chip
Author: / Rochit Rajsuman
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Embedded computer systems- Design and construction,Embedded computer systems- Testing,Application specific integrated circuits- Design and construction
Classification :
E-BOOK
![](/design/images/bookmore.png)
3. System-on-a-chip
Author: / Rochit Rajsuman
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Embedded computer systems- Design and construction,Embedded computer systems- Testing,Application specific integrated circuits- Design and construction
Classification :
TK7895
.
E42
,
R37
2000
![](/design/images/bookmore.png)
![](/design/images/visualshelfbtn.png)